Copy of `Reliability Plus - Product reliability terms`
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Reliability Plus - Product reliability terms
Category: General technical and industrial > Product reliability
Date & country: 16/12/2007, UK Words: 64
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N2Nitrogen (gaseous). Not useful as a cooling medium for environmental chambers
g RMSGravity root mean square â€` the unit of vibration acceleration. When specifying the g RMS figure for random vibration energy the frequency range (or bandwidth) of the applied vibration must always be stated for the figure to be meaningful
Vibration machine (or shaker)A device which produces controlled and reproducible mechanical vibration for the vibration testing of mechanical systems, components and structures
VibrationMechanical oscillation or motion about a reference point of equilibrium
VHALTVibration HALT; the part of the HALT process using random vibration stress under ambient conditions
Tri-axial(Vibration in) three linear orthogonal axes
UUTUnit under test. See also DUT or device under test
ThermocoupleAn electrical device used for temperature measurement. Two dissimilar metals joined together, making a continuous loop
Thermal cyclingSubjecting a product to predetermined temperature changes, between hot and cold extremes
THALTThermal HALT; the part of the HALT process that uses thermal stress only
Swept-sine testingSinewave vibration whose frequency is smoothly and continuously varied. Commonly required for sequentially identifying resonances.
Stress ScreeningA modern electronics production tool for precipitating latent defects (such as poor solder connections). Utilizes random vibration and rapid temperature cycling.
Stress Margin Evaluation (SME)An alternative term used to describe step stressing a UUT with thermal and random vibration stressors
Stress Concentration FactorRatio of the greatest stress in the area of a notch or other stress raiser to the corresponding nominal stress. It is a theoretical indication of the effect of stress concentrators on mechanical behaviour
Step stressingIncreasing stresses in a series of pre-selected increments
StressIntensity of applied load, usually at the site of a failure
Spectrum analyzerAn instrument which displays the frequency spectrum of an input signal, usually amplitude vertical vs. frequency horizontal
Soft failureA product under test ceases to operate correctly, but resumes correct operation when the stressing environment is eased. Also known as an intermittent failure. See hard failure. Note: All solid sate devices, notably memory storage elements, are subject to random 'soft-error' failures. Such failures are the consequence of high-energy alpha particles and cosmic radiation which can, for example, change the data in a storage cell. These are random and transient by nature and cannot be avoided
SIVLSuper Insulated Vacuum Line. A vacuum-insulated rigid or semi-flexible pipe used to transfer LN2, with the minimum of losses, from a bulk supply tank to an environmental test chamber. SIVL is obtained from and installed by specialist suppliers
ScreeningThe process of stressing products so that defective units can be identified, then repaired or replaced
Screen StrengthA term used to describe the likelihood that a particular stress screening process will precipitate latent defects in a UUT. Screen strength is usually expressed as a percentage or as a probability, and is best interpreted as a relative guide to the effectiveness of a process
Run-inContinuously powering a product under ambient conditions in order to accelerate the aging process. Unlikely to introduce significant acceleration. More effective when power cycling an assembly which itself dissipates heat, when it becomes a variant of thermal cycling
Root cause analysisDetermining what actually caused a failure, as opposed to what appears to have been the cause. Detailed knowledge of the UUT is required and the services of a specialized failure analysis lab may also be needed
ResponseThe vibratory motion or force that results from some mechanical input
RET Reliability Enhancement TestA term sometimes used to describe a range of design validation and accelerated life testing processes
ResonanceForced vibration of a true single DoF system causes resonance when the forcing frequency equals the natural frequency. More complex systems have many resonances
Repetitive shock machineA platform to which products (to be tested or screened) are attached. Often this platform forms the bottom surface of a thermal test chamber. Pneumatic vibrators are attached to the bottom of the platform, causing it to vibrate, usually simultaneously in several axes
ReliabilityReliability is the probability a device or system will NOT fail to perform its intended function(s) during a specified time interval when operated under stated conditions
RangeA statement of the upper and lower limits over which an instrument works satisfactorily
Random vibrationVibration whose instantaneous magnitudes cannot be predicted. May be broad-band, covering a wide, continuous frequency range, or narrow band, covering a relatively narrow frequency range. No periodic or deterministic components
Quasi RandomA form of random vibration energy with a frequency spectrum very similar, but not mathematically identical to, white noise derived random vibration energy. A quasi random vibration response is typically generated by a vibration table that utilises pneumatically actuated impact hammers
Proof of screenA process aimed at showing that a screen is effective in identifying latent defects in products but does not damage good products
PIDProportional Integral Derivative. Variable parameters used in a thermal chamber control system
Power spectral density or PSDDescribes the power of random vibration intensity, in mean-square acceleration per frequency unit, typically g²/Hz. Also known as Acceleration spectral density or ASD
Operational limitThe extremes beyond which a product is not expected to operate
Patent defectA flaw in the design, of a component part or in the manufacturing process of a product that has failed under test or screen. See Latent Defect
Operational environmentThe aggregate of all external and internal conditions (such as temperature, humidity, radiation, magnetic and electric fields, shock vibration, etc.) either natural or man made, or self-induced, that influences the form, operational performance, reliability or survival of an item
Natural frequencyThe frequency of an undamped system's free vibration; also, the frequency of any of the normal modes of vibration. Natural frequency drops when damping is present
MTTFAbbreviation for mean (or average) time to failure
Mechanical failureA malfunction consisting of cracking, excessive displacement, misalignment, loosening, etc
MTBFAbbreviation for mean (or average) time between failures
Mean-Time-To-Failure (MTTF)A basic measure of reliability for non-repairable items: The total number of life units of an item divided by the total number of failures within that population, during a particular measurement interval under stated conditions
LN2Liquid nitrogen, often used for rapid cooling of environmental test chambers. LN2 boils at â€`196°C and is stored in highly insulated, double-skinned, bulk storage, pressure vessels. Storage vessels must constantly allow excess pressure to be vented to atmosphere. Eventually all stored liquid will evaporate to gaseous nitrogen whether or not it is used for cooling purposes
Life Cycle TestingSubjecting products to stresses similar to those anticipated in actual service while collecting engineering data related to life expectancy, reliability, specification compliance, or product improvements. Usually aimed at determining the products' mean time between failures or MTBF
hertz(Abbreviated Hz) The unit of frequency
Latent defectA flaw in the design, of a component part or in the manufacturing process of a product, which is not immediately apparent visually or detectable by testing, but will result in a future failure - usually within the warranty period. See Patent Defect
HarmonicA sinusoidal quantity having a frequency that is an integral multiple (x2, x3, etc.) of a fundamental (x1) frequency
HASSHighly accelerated stress screening. See environmental stress screening (ESS)
HALTHighly accelerated life test. See accelerated life test
Hard failureA product under test ceases to work correctly. It does not resume correct operation, even when the stressing environment is eased. Differs from soft failure
Fundamental mode of vibrationThat mode having the lowest natural frequency
FixtureThe intermediate structure that attaches a device under test (DUT) to a shaker or shock test machine. Special fixtures may also be required to correctly mount product(s) inside a thermal cycling chamber during screening
EDElectro Dynamic, as in ED shaker. A shaker that generates vibration energy electro-magnetically
Failure mechanismThe mechanical, chemical, physical or other process that results in failure
DoFSee Degrees of freedom
DUTDevice under test. The component, sub-assembly or system being tested. See also UUT
Design limitThe operational limit of a product, beyond which it not required to function properly
Degrees of freedomIn mechanics, the total number of directions of motion of an assembly being evaluated. E.g. a ship or aircraft experiencing linear motion up and down, fore-and-aft and left-and-right motions as well as roll, pitch and yaw, is said to have six degrees of freedom
BandwidthThe frequency range in hertz (Hz) within which a measuring system can accurately measure a quantity
Burn-inContinuously powering a product at constant elevated temperature, in order to accelerate the aging process. Most effective for semiconductor components; relatively ineffective for screening circuit boards and assemblies. See Run In
Ambient conditionsThe conditions (e.g. temperature and humidity) characterizing the air or other medium that surrounds the UUT
AGREEA type of environmental test chamber designed to implement test procedures defined by the Advisory Group on Reliability of Electronic Equipment
Accelerated Stress TestingA post-production activity on a sampling (initially 100%) of units. The intent is to precipitate hidden or latent failures caused by poor workmanship and to prevent flawed units from reaching the next higher level of assembly or the customer. Intensity is determined from levels achieved in accelerated life testing
Accelerated Life TestingAn activity during development of a new product. Prototypes are subjected to stress levels (including vibration, usually random) that are much higher than those anticipated in the field. The purpose is to identify failure-prone, marginally-strong elements by causing them to fail. Those elements are strengthened and tests are continued at higher levels